10/12/2019 Marsurf Ps1 Explorer Software Inc
Description: PCE-RT 1200 Roughness Tester For quick, accurate measurement of Ra, Rz, Rq and Rt roughness parameters PCE-RT 1200 is a portable roughness tester used in many different material surface testing applications. The PCE-RT 1200 roughness tester has an internal memory. Common Specific Parameters: Roughness Average (Ra), Roughness - RMS (Rq), Mean Peak to Valley Height (Rtm, Rz), Total Roughness Height (Rt, PV). Display & Special Features: Digital Readout. Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.). Mounting / Loading: Handheld / Portable. Description: PCE-RT 2200 Roughness Tester For the measurement of surface texture or surface roughness Meet ISO, ANSI, DIN and JIS standards with PCE-RT 2200, a portable surface roughness tester with an easy-to-read LCD display, large internal memory and convenient USB port.
Software. Common Specific Parameters: Roughness Average (Ra), Roughness - RMS (Rq), Mean Peak to Valley Height (Rtm, Rz), Base Roughness Depth (R3Z), Maximum Peak Height (RP), Maximum Valley Depth (RV), Total Roughness Height (Rt, PV), Ten Point Height (Rz JIS), Kurtosis (Rku), Other. Display & Special Features: Digital Readout. Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.). Mounting / Loading: Handheld / Portable. Description: manufacturing processes as a controlling equipment.
The device indicates all calculated measurement results on its LCD display any time. In order to measure the roughness of a surface, the sensor is to be placed onto that surface. Afterwards the sensor samples evenly the surface. Common Specific Parameters: Roughness Average (Ra), Mean Peak to Valley Height (Rtm, Rz). Display & Special Features: Digital Readout. Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.). Mounting / Loading: Handheld / Portable.
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Description: Product features Roughness and contour measurement at a measuring station with MarSurf XCR 20 This combined measuring station allows both surface roughness and contour measurements to be performed at a single measuring station. Depending on the measuring task. Display & Special Features: Computer Interface / Networkable. Industrial Applications: Aerospace / Defense, Automotive, Mechanical Parts (Bearings, Shafting), Medical. Measuring Path / Scan Length: 0.0689 to 2.2 inch. Mounting / Loading: Benchtop. Description: roughness measuring system in one Clear time savings: parts are automatically measured in one setting New, highly precise air bearings for extremely reliable results Contour measurements with large deflection range of ±26 mm at resolution of 1.24 nanometers Roughness.
Feb 2, 2018 - MarSurf PS1 M Explorer, Free Download by Mahr GmbH. Pioneer in this area, as demonstrated by the company's numerous innovations.
Display & Special Features: Computer Interface / Networkable, SPC / Software Capability. Industrial Applications: Other. Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Specialty / Custom. Mounting / Loading: Floor / Free Standing.
Description: The XE-WAFER is a fully automated industrial AFM designed specifically to address surface roughness, trench width, depth, and angle measurements on 200mm & 300mm wafers in a production environment. The system provides superior accuracy and precision nanometrology over any other system.
Applications: Semiconductor Wafers. Form Factor: Monitor / Instrument. Measurement Capability: Critical Dimension / Trench Geometry, Defects / ADC, Roughness / Waviness. Mounting / Loading: Floor Mounted / Stand-alone. Description: Park Systems has revolutionized the AFM with the introduction of the XE-3DM, the fully automated AFM system designed for overhang and trench profiles, sidewall roughness and imaging, and critical angle measurements.
The unique design of the XE-3DM, made possible by the XE-series’. Applications: Semiconductor Wafers. Form Factor: Monitor / Instrument. Measurement Capability: Critical Dimension / Trench Geometry, Defects / ADC, Roughness / Waviness. Mounting / Loading: Floor Mounted / Stand-alone. Description: Bruker's Dektak® stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D.
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Display & Special Features: Computer Interface / Networkable. Industrial Applications: Electronics, Semiconductor Manufacturing, Other. Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness. Mounting / Loading: Benchtop, Floor / Free Standing.
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